3001. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors , Design and construction , Quality control,Integrated circuits , Measurement,Semiconductor wafers , Inspection,X-rays , Diffraction,Fluroscopy
رده :
E-BOOK
3002. Xicor data book
پدیدآورنده :
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : Handbooks, manuals, etc. ، Semiconductor storage devices,Handbooks, manuals, etc. ، Integrated circuits,Handbooks, manuals, etc. ، Metals oxide semiconductors
رده :
TK
7895
.
M4
.
X529
1987
3003. Yield and reliability in microwave circuit and system design
پدیدآورنده : Meehan, Michael D.
کتابخانه: Library of Niroo Research Institue (Tehran)
موضوع : ، Microwave integrated circuits- Design and construction- Statistical methods,، Engineering design- Statistical methods,، Computer- aided design
3004. Yield simulation for integrated circuits
پدیدآورنده : Walker, Duncan Moore Henry.
کتابخانه: Library of Niroo Research Institue (Tehran)
موضوع : ، Integrated circuits- Very large scale integration- Design and construction- Mathematical models,، Integrated circuits- Very large scale integration- Design and construction- Data processing,، Integrated circuits- Very large scale integration- Defects- Mathematical models,، Integrated circuits- Very large scale integration- Defects- Data processing,، Monte Carlo method
3005. abc's of integrated circuits
پدیدآورنده : Turner, R. P.
کتابخانه: Central Library and Documentation Center (Kerman)
موضوع : ، Electronic circuits,، Microelectronics,، Integrated circuits
رده :
TK
7877
.
T88
1971